Insights into the Ultra-Steep Subthreshold Slope Gate-all-around Feedback-FET for memory and sensing applications

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Authors: Naveen Kumar; Ankit Dixit; Ali Rezaei; Tapas Dutta; César Pascual García; Vihar Georgiev

Journal title: 2023 IEEE Nanotechnology Materials and Devices Conference

Journal number: NMDC 2023

Journal publisher: IEEE Xplore

Published year: 2023

Published pages: 617-620

DOI identifier: 10.1109/nmdc57951.2023.10343913

ISBN: 979-8-3503-3546-0