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Authors: Naveen Kumar; César Pascual García; Ali Rezaei; Ankit Dixit; Asen Asenov; Vihar Georgiev
Journal title: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Journal publisher: IEEE Xplore
Published year: 2023
DOI identifier: 10.23919/sispad57422.2023.10319578
ISBN: 979-8-3503-1368-0