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Authors: Franz Marcus Schüffny, Sebastian Höppner, Stefan Hänzsche, Richard Miru George, Seyed Mohammad Ali Zeinolabedin, Christian Mayr
Journal title: IEEE Solid-State Circuits Letters
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/lssc.2023.3270243
ISSN: 2573-9603