Automated RRAM measurements using a semi-automated probe station and ArC ONE interface.

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Alin G. Panca, Alexantrou Serb, Spyros Stathopoulos, Suresh K. Garlapati, Themis Prodromakis

Journal title: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.1109/icmts55420.2023.10094156

ISBN: 979-8-3503-4653-4