A Steep-Slope MoS 2 -Nanoribbon MOSFET Based on an Intrinsic Cold-Contact Effect

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Authors: Demetrio Logoteta, Marco G. Pala, Jean Choukroun, Philippe Dollfus, Giuseppe Iannaccone

Journal title: IEEE Electron Device Letters

Journal number: 40/9

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 1550-1553

DOI identifier: 10.1109/led.2019.2928131

ISSN: 0741-3106