Electromagnetically induced transparency in inhomogeneously broadened divacancy defect ensembles in SiC

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Authors: Olger V. Zwier; Tom Bosma; Carmem M. Gilardoni; Xu Yang; Alexander R. Onur; Takeshi Ohshima; Nguyen T. Son; Caspar H. van der Wal

Journal title: Journal of Applied Physics, 131:094401. AMER INST PHYSICS

Journal publisher: American Institute of Physics

Published year: 2022

DOI identifier: 10.1063/5.0077112

ISSN: 0003-6951