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Authors: Florin Ciubotaru, Giacomo Talmelli, Thibaut Devolder, Odysseas Zografos, Marc Heyns, Christoph Adelmann, Iuliana P. Radu
Journal title: 2018 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2018
Published pages: 36.1.1-36.1.4
DOI identifier: 10.1109/iedm.2018.8614488
ISBN: 978-1-7281-1987-8