n-bit Data Parallel Spin Wave Logic Gate

Summary

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Authors: Abdulqader Mahmoud, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Sorin Cotofana, Said Hamdioui

Journal title: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Journal publisher: IEEE

Published year: 2020

Published pages: 642-645

DOI identifier: 10.23919/date48585.2020.9116368

ISBN: 978-3-9819263-4-7