Highly-Sensitive Phase and Frequency Noise Measurement Technique Using Bayesian Filtering

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Darko Zibar, Hou-Man Chin, Yeyu Tong, Nitin Jain, Joel Guo, Lin Chang, Tobias Gehring, John E. Bowers, Ulrik L. Andersen

Journal title: IEEE Photonics Technology Letters

Journal number: 31/23

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 1866-1869

DOI identifier: 10.1109/lpt.2019.2945051

ISSN: 1041-1135