Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope

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Authors: Daen Jannis; Knut Müller-Caspary; Armand Béché; Jo Verbeeck

Journal title: Applied Sciences

Journal publisher: MDPI

Published year: 2021

DOI identifier: 10.3390/app11199058

ISSN: 2076-3417