Perspectives on testing fundamental physics with highly charged ions in Penning traps

Summary

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Authors: K. Blaum, S. Eliseev, S. Sturm

Journal title: Quantum Sci. Technol.

Journal publisher: IOP Publishing

Published year: 2020

DOI identifier: 10.1088/2058-9565/abbc75

ISSN: 2058-9565