Practical sensorless aberration estimation for 3D microscopy with deep learning

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Debayan Saha, Uwe Schmidt, Qinrong Zhang, Aurelien Barbotin, Qi Hu, Na Ji, Martin J. Booth, Martin Weigert, Eugene W. Myers

Journal title: Optics Express

Journal number: 28/20

Journal publisher: Optical Society of America

Published year: 2020

Published pages: 29044

DOI identifier: 10.1364/oe.401933

ISSN: 1094-4087