Recent Trends and Perspectives on Defect-Oriented Testing

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Authors: P. Bernardi; R. Cantoro; A. Coyette; W. Dobbeleare; M. Fieback; A. Floridia; Georges Gielen; J. Gomez; M. Grosso; A. Guerriero; I. Guglielminetti; S. Hamdioui; G. Insinga; N. Mautone; N. Mirabella; S. Sartoni; M. Sonza Reorda; R. Ullmann; R. Vanhooren; Nektar Xama; L. Wu

Journal title: proceedings 2022 IEEE 28TH INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2022)

Journal number: 2022

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/iolts56730.2022.9897647