Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs using SVM Classifiers

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Authors: Nektar Xama; Jhon Gomez Caicedo; Georges Gielen

Journal title: IEEE Transactions on Computer-Aided Design of Integrated Circuits And Systems

Journal number: 2023

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2023

DOI identifier: 10.1109/tcad.2023.3244892

ISSN: 0278-0070