Towards a better understanding of OPD limitations for higher sensitivity and contrast at the VLTI

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Authors: B. Courtney-Barrer, J. Woillez, R. Laugier, A. Bigioli, N. Schuhler, P. Guajardo, V. Lizana, N. Behara, F. Eisenhauer, M. Ireland, X. Haubois, D. Defrère

Journal title: Proceedings of SPIE, Optical and Infrared Interferometry and Imaging VIII

Journal number: Vol. 12183, id. 1218328

Journal publisher: Society of Photo-Optical Instrumentation Engineers

Published year: 2022

DOI identifier: 10.1117/12.2628835