Fully automated, sequential focused ion beam milling for cryo-electron tomography

Summary

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Authors: Tobias Zachs, Andreas Schertel, João Medeiros, Gregor L Weiss, Jannik Hugener, Joao Matos, Martin Pilhofer

Journal title: eLife

Journal number: 9

Journal publisher: eLife Sciences Publications

Published year: 2020

DOI identifier: 10.7554/elife.52286

ISSN: 2050-084X