Robust workflow and instrumentation for cryo-focused ion beam milling of samples for electron cryotomography

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Authors: João M. Medeiros, Désirée Böck, Gregor L. Weiss, Romain Kooger, Roger A. Wepf, Martin Pilhofer

Journal title: Ultramicroscopy

Journal number: 190

Journal publisher: Elsevier BV

Published year: 2018

Published pages: 1-11

DOI identifier: 10.1016/j.ultramic.2018.04.002

ISSN: 0304-3991