Centroid Loss for Weakly-Supervised Semantic Segmentation in a Quality-Control Application

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Authors: Kai Yao, Alberto Ortiz, Francisco Bonnin-Pascual

Journal title: 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)

Journal number: annual

Journal publisher: IEEE

Published year: 2020

Published pages: 1239-1242

DOI identifier: 10.1109/etfa46521.2020.9212160

ISBN: 978-1-7281-8956-7