A Weakly-Supervised Semantic Segmentation Approach Based on the Centroid Loss: Application to Quality Control and Inspection

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Authors: Kai Yao, Alberto Ortiz, Francisco Bonnin-Pascual

Journal title: IEEE Access

Journal number: 9

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2021

Published pages: 69010-69026

DOI identifier: 10.1109/access.2021.3077847

ISSN: 2169-3536