A thorough study of Si nanowire FETs with 3D Multi-Subband Ensemble Monte Carlo simulations

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Authors: L. Donetti, C. Sampedro, F.G. Ruiz, A. Godoy, F. Gamiz

Journal title: Solid-State Electronics

Journal number: 159

Journal publisher: Pergamon Press Ltd.

Published year: 2019

Published pages: 19-25

DOI identifier: 10.1016/j.sse.2019.03.044

ISSN: 0038-1101