Kink effect in ultrathin FDSOI MOSFETs

Summary

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Authors: H.J. Park, M. Bawedin, H.G. Choi, S. Cristoloveanu

Journal title: Solid-State Electronics

Journal number: 143

Journal publisher: Pergamon Press Ltd.

Published year: 2018

Published pages: 33-40

DOI identifier: 10.1016/j.sse.2017.12.002

ISSN: 0038-1101