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Authors: Francois Tcheme Wakam, Joris Lacord, Maryline Bawedin, Sebastien Martinie, Sorin Cristoloveanu, Jean-Charles Barbe
Journal title: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Journal publisher: IEEE
Published year: 2018
Published pages: 115-118
DOI identifier: 10.1109/SISPAD.2018.8551653
ISBN: 978-1-5386-6790-3
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