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Authors: S. Martinie, J. Lacord, O. Rozeau, M.-S. Parihar, Kyunghwa Lee, Maryline Bawedin, Sorin Cristoloveanu, Yuan Taur, J-C. Barbe
Journal title: 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
Journal publisher: IEEE
Published year: 2017
Published pages: 1-3
DOI identifier: 10.1109/S3S.2017.8309240
ISBN: 978-1-5386-3766-1
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