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Authors: Santiago Navarro, Carlos Navarro, Carlos Marquez, Hassan El Dirani, Philippe Galy, Maryline Bawedin, Andy Pickering, Sorin Cristoloveanu, Francisco Gamiz
Journal title: IEEE Electron Device Letters
Journal number: 39/5
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 660-663
DOI identifier: 10.1109/led.2018.2819801
ISSN: 0741-3106