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Authors: F. Tcheme Wakam, J. Lacord, M. Bawedin, S. Martinie, S. Cristoloveanu, G. Ghibaudo, J.-Ch. Barbe
Journal title: 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-4
DOI identifier: 10.1109/ULIS.2018.8354339
ISBN: 978-1-5386-4811-7
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