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Authors: Carlos Navarro, Santiago Navarro, Carlos Marquez, Luca Donetti, Carlos Sampedro, Siegfried Karg, H. Riel, Francisco Gamiz
Journal title: IEEE Journal of the Electron Devices Society
Journal number: 6/1
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2018
Published pages: 884-892
DOI identifier: 10.1109/jeds.2018.2859233
ISSN: 2168-6734