Z 2 -FET memory matrix in 28 nm FDSOI technology

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Mukta Singh Parihar, Kyung Hwa Lee, Hyung Jin Park, Carlos Navarro, Joris Lacord, Francisco Gamiz, Philippe Galy, Sorin Cristoloveanu, Maryline Bawedin

Journal title: 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

Journal publisher: IEEE

Published year: 2018

Published pages: 1-4

DOI identifier: 10.1109/ULIS.2018.8354341

ISBN: 978-1-5386-4811-7