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Authors: Mukta Singh Parihar, Kyung Hwa Lee, Hassan El Dirani, Carlos Navarro, Joris Lacord, Sebastien Martinie, Jean-Charles Barbe, Pascal Fonteneau, Philippe Galy, Cyrille Le Royer, Xavier Mescot, Francisco Gamiz, Binjie Cheng, Asen Asenov, Yuan Taur, Mayline Bawedin, Sorin Cristoloveanu
Journal title: 2017 IEEE International Memory Workshop (IMW)
Journal publisher: IEEE
Published year: 2017
Published pages: 1-4
DOI identifier: 10.1109/IMW.2017.7939093
ISBN: 978-1-5090-3274-7
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