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Authors: Mukta Singh Parihar, Kyung Hwa Lee, Maryline Bawedin, Joris Lacord, Sebastien Martinie, Jean-Charles Barbe, Yue Xu, Yuan Taur, Sorin Cristoloveanu
Journal title: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
Journal publisher: IEEE
Published year: 2017
Published pages: 57-60
DOI identifier: 10.1109/ULIS.2017.7962600
ISBN: 978-1-5090-5313-1
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