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Authors: Hyungjin Park, Kyunghwa Lee, Jean-Pierre Colinge, Sorin Cristoloveanu
Journal title: 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-3
DOI identifier: 10.1109/S3S.2018.8640198
ISBN: 978-1-5386-7627-1