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Authors: Joris Lacord, Mukta Singh Parihar, Carlos Navarro, Francois Tcheme Wakam, Maryline Bawedin, Sorin Cristoloveanu, Fransisco Gamiz, Jean-Charles Barbe
Journal title: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Journal publisher: IEEE
Published year: 2018
Published pages: 198-201
DOI identifier: 10.1109/SISPAD.2018.8551674
ISBN: 978-1-5386-6790-3
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