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Authors: M. Bawedin, H. El Dirani, K. Lee, M.S. Parihar, J. Lacord, S. Martinie, C. Le Royer, J.-Ch. Barbe, X. Mescot, P. Fonteneau, Ph. Galy, F. Gamiz, C. Navarro, B. Cheng, A. Asenov, Y. Taur, S. Cristoloveanu
Journal title: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
Journal publisher: IEEE
Published year: 2017
Published pages: 51-52
DOI identifier: 10.1109/ULIS.2017.7962598
ISBN: 978-1-5090-5313-1
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