First report on interface dielectric trap and RF (S parameter and NF) characterization of devices operated at cryogenic condition

Summary
First report on interface dielectric trap and RF (S parameter and NF) characterization of devices operated at cryogenic condition
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Web resources: https://ec.europa.eu/research/participants/documents/downloadPublic?documentIds=080166e5dee9b9b6&appId=PPGMS
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