The Role of Oxide Traps Aligned With the Semiconductor Energy Gap in MOS Systems

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Authors: Enrico Caruso, Jun Lin, Scott Monaghan, Karim Cherkaoui, Farzan Gity, Pierpaolo Palestri, David Esseni, Luca Selmi, Paul K. Hurley

Journal title: IEEE Transactions on Electron Devices

Journal number: 67/10

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2020

Published pages: 4372-4378

DOI identifier: 10.1109/ted.2020.3018095

ISSN: 0018-9383