Summary
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Authors: Christian Enz, Arnout Beckers, Farzan Jazaeri
Journal title: 2020 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2020
Published pages: 25.3.1-25.3.4
DOI identifier: 10.1109/iedm13553.2020.9371894
ISBN: 978-1-7281-8888-1
