Development Testing of a XYZ Scanner for Atomic Force Microscope

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Authors: Kunhai Cai, Xianbin He, Yanling Tian, Xianping Liu, Liangyu Cui

Journal title: EMBEC & NBC 2017

Journal publisher: Springer Singapore

Published year: 2017

Published pages: 326-329

DOI identifier: 10.1007/978-981-10-5122-7_82

ISBN: 978-981-10-5121-0