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Authors: Xiaohui Ning, Qingling Meng, Li Li, Yonglu Han, Dongyang Zhou, Liang Cao, Zhankun Weng, Ran Ding, Zuobin Wang, Zuobin Wang
Journal title: 2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
Journal publisher: IEEE
Published year: 2017
Published pages: 375-378
DOI identifier: 10.1109/3M-NANO.2017.8286336
ISBN: 978-1-5386-1081-7