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Authors: A. Ferraris, E. Cha, P. Mueller, T. Morf, M. Prathapan, M. Sousa, H.-C. Han, C. Enz, C. B. Zota
Journal title: 2022 International Electron Devices Meeting (IEDM)
Journal publisher: 2022 International Electron Devices Meeting (IEDM)
Published year: 2022
DOI identifier: 10.1109/iedm45625.2022.10019536