In-depth electrical characterization of deca-nanometer InGaAs MOSFET down to cryogenic temperatures for low-power quantum applications

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Authors: Francesco Serra Di Santa Maria, Christoforos Theodorou, Francis Balestra, Gerard Ghibaudo, Eunjung Cha, Cezar B. Zota

Journal title: IEEE 52nd European Solid-State Device Research Conference (ESSDERC)

Journal publisher: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)

Published year: 2022

DOI identifier: 10.1109/essderc55479.2022.9947142