Cryogenic InGaAs HEMTs with Reduced On-resistance using Strained Ohmic Contacts

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Authors: Eunjung Cha, Alberto Ferraris, Peter Mueller, Hung-Chi Han, Daniele Caimi, Marilyne Sausa, Christian Enz, and Cezar Zota

Journal title: IEEE International Electron Devices Meeting 2023

Journal publisher: IEEE

Published year: 2024