Experimental Study of Self-Heating Effect in InGaAs HEMTs for Quantum Technologies Down to 10K

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Authors: F. Serra Di Santa Maria, F. Balestra, C. Theodorou, G. Ghibaudo, C. B. Zota, E. Cha

Journal title: 2023 IEEE International Reliability Physics Symposium (IRPS)

Journal publisher: 2023 IEEE International Reliability Physics Symposium (IRPS)

Published year: 2023

DOI identifier: 10.1109/irps48203.2023.10118294

ISBN: 978-1-6654-5672-2