Summary
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Authors: H. Bohuslavskyi, S. Barraud, V. Barral, M. Casse, L. Le Guevel, L. Hutin, B. Bertrand, A. Crippa, X. Jehl, G. Pillonnet, A. G. M. Jansen, F. Arnaud, P. Galy, R. Maurand, S. De Franceschi, M. Sanquer, M. Vinet
Journal title: IEEE Transactions on Electron Devices
Journal number: 65/9
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 3682-3688
DOI identifier: 10.1109/TED.2018.2859636
ISSN: 0018-9383