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Authors: L. Hutin, L. Bourdet, B. Bertrand, A. Corna, H. Bohuslavskyi, A. Amisse, A. Crippa, R. Maurand, S. Barraud, M. Urdampilleta, C. Bauerle, T. Meunier, M. Sanquer, X. Jehl, S. De Franceschi, Y.-M. Niquet, M. Vinet
Journal title: 2018 IEEE Symposium on VLSI Technology
Journal publisher: IEEE
Published year: 2018
Published pages: 125-126
DOI identifier: 10.1109/VLSIT.2018.8510665
ISBN: 978-1-5386-4218-4