Characterization and Modeling of 28-nm Bulk CMOS Technology Down to 4.2 K

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Authors: Arnout Beckers, Farzan Jazaeri, Christian Enz

Journal title: IEEE Journal of the Electron Devices Society

Journal number: 6

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2018

Published pages: 1007-1018

DOI identifier: 10.1109/JEDS.2018.2817458

ISSN: 2168-6734