Cryogenic MOSFET Threshold Voltage Model

Summary

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Authors: Arnout Beckers, Farzan Jazaeri, Christian Enz

Journal title: ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)

Journal publisher: IEEE

Published year: 2019

Published pages: 94-97

DOI identifier: 10.1109/essderc.2019.8901806

ISBN: 978-1-7281-1539-9