Gate-based high fidelity spin readout in a CMOS device

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Authors: Matias Urdampilleta, David J. Niegemann, Emmanuel Chanrion, Baptiste Jadot, Cameron Spence, Pierre-André Mortemousque, Christopher Bäuerle, Louis Hutin, Benoit Bertrand, Sylvain Barraud, Romain Maurand, Marc Sanquer, Xavier Jehl, Silvano De Franceschi, Maud Vinet, Tristan Meunier

Journal title: Nature Nanotechnology

Journal number: 14/8

Journal publisher: Nature Publishing Group

Published year: 2019

Published pages: 737-741

DOI identifier: 10.1038/s41565-019-0443-9

ISSN: 1748-3387