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Authors: S. De Franceschi, L. Hutin, R. Maurand, L. Bourdet, H. Bohuslavskyi, A. Corna, D. Kotekar-Patil, S. Barraud, X. Jehl, Y.-M. Niquet, M. Sanquer, M. Vinet
Journal title: 2016 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2016
Published pages: 13.4.1-13.4.4
DOI identifier: 10.1109/iedm.2016.7838409
ISBN: 978-1-5090-3902-9