TDO-CIM: Transparent Detection and Offloading for Computation In-memory

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Authors: Kanishkan Vadivel, Lorenzo Chelini, Ali BanaGozar, Gagandeep Singh, Stefano Corda, Roel Jordans, Henk Corporaal

Journal title: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Journal publisher: IEEE

Published year: 2020

Published pages: 1602-1605

DOI identifier: 10.23919/DATE48585.2020.9116464

ISBN: 978-3-9819263-4-7