Summary
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Authors: Aritrio Bandyopadhyay, Fabio Pavanello , Emilien Peytavi, Jean-Francois Lampin, Malek Zegaoui Mohammed Zaknoune, P. Szriftgiser, Guillaume Ducournau
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/irmmw-thz50926.2021.9566991