In-Situ Liquid Phase Electron Microscopy of Beam-Sensitive Materials

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Hanglong Wu, Alessandro Ianiro, Mark M. J. van Rijt, Arthur D. A. Keizer, A. Catarina C. Esteves, Remco Tuinier, Heiner Friedrich, Nico. A.J.M. Sommerdijk, Joseph P. Patterson

Journal title: Microscopy and Microanalysis

Journal number: 25/S1

Journal publisher: Cambridge University Press

Published year: 2019

Published pages: 63-64

DOI identifier: 10.1017/s1431927618016045

ISSN: 1431-9276